A high resolution electron beam profile monitor

被引：0
|
作者：
Graves, WS [1 ]
Johnson, ED [1 ]
O'Shea, PG [1 ]
机构：
[1] Brookhaven Natl Lab, NSLS, Upton, NY 11973 USA
来源：
PROCEEDINGS OF THE 1997 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-3: PLENARY AND SPECIAL SESSIONS ACCELERATORS AND STORAGE RINGS - BEAM DYNAMICS, INSTRUMENTATION, AND CONTROLS | 1998年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the tranverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.
引用
收藏
页码：1993 / 1995
页数：3
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