Fringe localization in wavefront division interferometers

被引：2

作者：

Simon, JM ^{[1
]}

Echarri, RM ^{[1
]}

Simon, MC ^{[1
]}

Garea, MT ^{[1
]}

机构：

[1] Univ Buenos Aires, Fac Ciencias Exactas & Nat, Dept Fis, Lab Opt, RA-1428 Buenos Aires, DF, Argentina

来源：

OPTIK | 2001年 / 112卷 / 06期

关键词：

interferometers; fringe localisation;

D O I：

10.1078/0030-4026-00049

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

When an amplitude division interferometer is illuminated by an extended incoherent source the fringes are localized. If the incoherent source is a periodic array of sources or if it continuous, there is a fundamental difference at the observation space and this is the appearance of several (more than one) localization surfaces. In the present paper it is stated that localized fringes can also be obtained in wavefront division interferometers provided the source is incoherent and periodic. As an example, the multiple localization planes in Fresnel's biprism are shown and experimental results are compared to the theoretical ones.

引用

页码：255 / 258

页数：4

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