Trapped ion source

被引：0

作者：

Brautti, G ^{[1
]}

Boggia, A ^{[1
]}

Raino, A ^{[1
]}

Ceci, N ^{[1
]}

Valentino, V ^{[1
]}

Variale, V ^{[1
]}

机构：

[1] Ist Nazl Fis Nucl, Dipartimento Fis, Sez Bari, Bari, Italy

来源：

PROCEEDINGS OF THE 1997 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-3: PLENARY AND SPECIAL SESSIONS ACCELERATORS AND STORAGE RINGS - BEAM DYNAMICS, INSTRUMENTATION, AND CONTROLS | 1998年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper it is shown the design and the mechanical construction of a Trapped Ion Source (TIS). TIS is a new type of source capable, in principle, of producing very highly charged ions and, at the same time, it is a radio frequency quadrupoles linear trap suitable to study the interaction of the trapped ions (or charged microparticles) with electrons, high energy particles or laser beams. Tn practice, it is a modified version of an Electron Beam Ion Trap (EBIT) recently developed in some laboratories mainly to study X and UV rays spectroscopy for "hydrogenic" and "helium-like" ions. Among the goal of TIS, other than the production of highly charged particle, it can be foreseen the production and trapping of radioactive isotopes, ion cooling, analysis of macromolecules and also "dust targets" for high energy accelerators.

引用

页码：2729 / 2731

页数：3

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