Thermal design and test verification of the solar X-Ray and extreme ultraviolet imager

被引:6
|
作者
Li, Shijun [1 ,2 ]
Chen, Liheng [1 ]
Yang, Yuting [1 ,2 ]
机构
[1] Chinese Acad Sci, Changchun Inst Opt, Fine Mech & Phys, Changchun 130033, Jilin, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
来源
OPTIK | 2020年 / 203卷 / 203期
基金
国家重点研发计划;
关键词
Thermal design; Thermal control; CCD; Thermal balance test;
D O I
10.1016/j.ijleo.2019.164017
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper describes a detailed thermal design scheme to ensure the low-temperature detection requirements of the solar X-ray and extreme ultraviolet imager (XEUVI) under complex external heat flux conditions. First, the structure, working mode and internal heat sources of the imager are introduced. Second, the thermal design scheme is proposed with a combination of active and passive thermal controls. Finally, a thermal balance test of XEUVI was performed in a vacuum environment. The test results showed that the CCD temperature ranged from -65.6 degrees C to -56.3 degrees C, the optical system temperature ranged from 12.9 degrees C to 22.0 degrees C, the frame temperature ranged from -4.6 degrees C to 20.3 degrees C, the motor temperature ranged from 1.0 degrees C to 19.8 degrees C, and the electrical box temperature ranged from -2 degrees C to 38.8 degrees C. The results of testing meet the requirements of the thermal control indices, and the thermal balance test verifies the correctness of the thermal design.
引用
收藏
页数:10
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