Fluctuation-induced tunneling dominated electrical transport in multi-layered single-walled carbon nanotube films

被引:8
|
作者
Zhao, Yanli [1 ]
Li, Wenzhi [2 ]
机构
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Sch Optoelect Sci & Engn, Wuhan 430074, Peoples R China
[2] Florida Int Univ, Dept Phys, Miami, FL 33199 USA
关键词
Single-walled carbon nanotubes; Thin films; Tunneling; Temperature coefficient; Bolometer; Atomic force microscopy; TRANSPARENT; CONDUCTIVITY; FABRICATION; PERCOLATION;
D O I
10.1016/j.tsf.2011.05.059
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Low temperature measurements may give some insight into the transport mechanism of single-walled carbon nanotube (SWCNT) films, which could lead to an optimal SWCNT film with designed photoelectric properties. Despite intense research efforts on the low temperature transport in SWCNT films, it is still an open question for the low temperature transport in multi-layered SWCNT films. In this work, the multi-layered SWCNT films were prepared with a layer by layer vacuum filtration. It suggests that the space between different layers of the multi-layered SWCNT can be ignored. For deposition of different-layered SWCNT films using the same total amount of SWCNT suspension, the increase of the layer numbers can reduce the density of the resulting films, which may account for the low temperature transport. The effect of thermal annealing and subsequent nitric acid treatment on the electrical properties of the SWCNT films has also been investigated. At the temperature range of 80-300 K, the transport of the multi-layered SWCNT films can be explained by a fluctuation-induced tunneling model. Our results could build a bridge connecting measured temperature coefficient of resistance and the microscopic tunneling barrier. (C) 2011 Elsevier B.V. All rights reserved.
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页码:7987 / 7991
页数:5
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