Three-intensity measurement technique and its measurement in elliptical retarder

被引：9
|
作者：
Lin, P. L. [1 ]
Han, C. Y. [2 ]
Chao, Y. F. [1 ]
机构：
[1] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu, Taiwan
[2] Natl United Univ, Dept Electroopt Engn, Miaoli, Taiwan
来源：
OPTICS COMMUNICATIONS | 2008年 / 281卷 / 13期
关键词：
elliptical retarder; TN-LC cell; polarimetry;
D O I：
10.1016/j.optcom.2008.02.042
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A three-intensity technique is applied in polarimetry for measuring the physical parameters of an elliptical retarder. In this study, quartz and mica quarter wave plates are distinguished by two models: linear retarder and elliptical retarder. By considering the twist nematic liquid crystal cell as an elliptical retarder, we are able to relate the effective optic axis to its rubbing direction and twist angle. All its physical parameters can be deduced from the model. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：3403 / 3406
页数：4
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