Infrared detector performance in an area array

被引:2
|
作者
Dhar, V [1 ]
Gopal, V [1 ]
机构
[1] Solid State Phys Lab, Delhi 110054, India
关键词
detector arrays; quantum efficiency; resistance-area product; infrared; photodiode;
D O I
10.1117/1.1356706
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The performance of an IR detector in an area array is studied by numerically solving the 2-D diffusion equation for thermal and photogenerated carriers. The zero-bias resistance area product R(0)A, quantum efficiency eta, and the noise equivalent temperature difference NETD for diodes of different size and junction depth are calculated for long wavelength infrared (LWIR) HgCdTe n(+)-on-p diffusion-limited diodes in the backside illuminated configuration. The 2-D calculations incorporate thermally generated- and photocarriers that originate under the junction (the "normal" current), as well as those that originate from around the junction (the lateral current). The calculation of the diffusion currents-both optical and thermally generated carriers-is made using a trapezoidal grid, which better fits the symmetry of diodes in an area array. The present results are compared with previous calculations in which a uniform grid was used. The results of R(0)A and eta calculated by the uniform and trapezoidal grids differ significantly, especially for diodes with deep junctions or diodes that are small compared to the center-to-center distance between diodes. Both the uniform and trapezoidal grid calculations have been compared with spot scan measurements and Semicad simulation in a stripe diode array in the literature. (C) 2001 society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:679 / 691
页数:13
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