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- [1] Electrical properties of Jurkat cells: an inverted scanning microwave microscope study PROCEEDINGS OF THE 2020 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2020, : 237 - 240
- [3] Inverted Scanning Microwave Microscopy for Nanometer-scale Imaging and Characterization of Platinum Diselenide 2019 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), 2019, : 1115 - 1117
- [5] Quantitative characterization of semiconductor structures with a scanning microwave microscope REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (02):
- [8] Integration of a Scanning Microwave Microscope and a Scanning Electron Microscope: Towards a new instrument to imaging, characterizing and manipulating at the nanoscale 2014 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO), 2014, : 39 - 43
- [9] Nanoscale Materials and Device Characterization via a Scanning Microwave Microscope IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONICS SYSTEMS (COMCAS 2009), 2009,
- [10] Development of the scanning electrochemical microscope (SECM) for biological imaging. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 219 : U91 - U92