Statistical substantiation of parametrization of a film model in reflectometry

被引：0
|
作者：
Konovalov, OV
Samoilenko, II
Feigin, LA
Shchedrin, BM
Yanusova, LG
机构：
[1] Russian Acad Sci, AV Shubnikov Crystallog Inst, Moscow 117333, Russia
[2] Moscow MV Lomonosov State Univ, Moscow 119899, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 1999年 / 44卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
The determination of the optimum number of model parameters in the restoration of the structure of a layer system from X-ray and neutron reflectivity data is considered. It is shown that, in order to avoid erroneous conclusions about the significance of the model parameters, one has to estimate the errors of their determination.
引用
收藏
页码：319 / 323
页数：5
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