Optimization of thermal field of 150 mm SiC crystal growth by PVT method

被引:12
|
作者
Zhang, Shengtao [1 ]
Fan, Guofeng [2 ]
Li, Tie [3 ]
Zhao, Lili [1 ]
机构
[1] Harbin Inst Technol, Sch Chem & Chem Engn, Harbin 150001, Heilongjiang, Peoples R China
[2] Soft Impact China Harbin Ltd, Harbin 150028, Heilongjiang, Peoples R China
[3] Harbin KY Semicond Inc, Harbin 150028, Heilongjiang, Peoples R China
关键词
SILICON-CARBIDE;
D O I
10.1039/d2ra02875a
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The excellent physical properties of SiC as an electronic material determine its important application prospects, especially in the new-energy industry, but the preparation of large-sized materials with high quality is not easy. Therefore, the physical fields in the growth process were modeled and studied with the help of the numerical simulation software Virtual Reactor, and its accuracy was verified by the agreement between morphology of the experimental crystal and the simulation. Additionally, the effects of thermal insulation adjustment of crystal growth thermal fields, application of seed crystals with different diameters, and shelter structure on the crystal growth process were also studied. By optimizing the crystal growth conditions, a nearly flat and slightly convex crystal growth interface was obtained successfully in our lab. Crystal quality was significantly improved, and a 6-inch SiC crystal with single polytype, high quality and low defects was successfully prepared.
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页码:19936 / 19945
页数:10
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