Activity of Sub-Band Gap States in Ferroelectric Pb(Zr0.2Ti0.8)O3 Thin Films

被引:4
|
作者
Ramakrishnegowda, Niranjan [1 ,2 ]
Yun, Yeseul [1 ,2 ]
Knoche, David S. [1 ,2 ]
Muehlenbein, Lutz [1 ,2 ]
Li, Xinye [1 ,2 ]
Bhatnagar, Akash [1 ,2 ]
机构
[1] Zentrum Innovationskompetenz SiLi Nano, D-06120 Halle, Saale, Germany
[2] Martin Luther Univ Halle Wittenberg, Inst Phys, D-06120 Halle, Saale, Germany
关键词
Pb(Zr; (0); 2Ti; 8)O; (3); persistent photoconductivity; polarization relaxation; thermally stimulated current; PERSISTENT PHOTOCONDUCTIVITY; THICKNESS DEPENDENCE; PZT; FATIGUE; SRBI2TA2O9; CURRENTS; IMPRINT;
D O I
10.1002/aelm.201900966
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Defect or intermediate states within the band gap of ferroelectric oxides are known to impact functional characteristics such as saturated polarization. However, depending upon their respective position, such levels can also induce a substantial photoelectrical response under appropriate illumination and severely impact the conduction mechanism of an otherwise highly insulating material system. Sub-band-gap illumination is used to highlight the activity of these levels in epitaxially grown and ferroelectric Pb(Zr0.2Ti0.8)O-3 thin films. Large transient effects are observed in relation to ferroelectric polarization and conductivity after illumination. In the case of polarization, light induces a "leaky" character, which eventually decays over a period of nearly 1.5 h. In conjunction, persistent photoconductivity is observed as the enhanced conductivity attained under illumination gradually decays over several minutes after removal of illumination. Thermally stimulated currents are measured to probe the presence of sub-band gap states and analyze their effect over a wide range of temperature. The trapping nature of the states and their role in the conduction is found to be the underlying origin.
引用
收藏
页数:7
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