Temperature Dependence of the Critical Thickness of d-Wave Superconducting Films

被引:3
|
作者
Miyawaki, Nobumi [1 ]
Higashitani, Seiji [1 ]
机构
[1] Hiroshima Univ, Grad Sch Integrated Arts & Sci, Kagamiyama 1-7-1, Higashihiroshima 7398521, Japan
关键词
d-wave superconducting film; critical thickness; Fermi-surface effect; Fulde-Ferrell-Larkin-Ovchinnikov state; two-dimensional system; LARKIN-OVCHINNIKOV STATE; FULDE-FERRELL STATE; FIELD; MODEL;
D O I
10.1016/j.phpro.2015.05.099
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a theoretical study of the critical thickness for a broken time-reversal state that may arise in d-wave superconducting films. By examining the effect of the Fermi surface shape on the critical thickness on the basis of a square lattice tight-binding model, we found that a substantial reduction of the critical thickness occurs near the half-filled limit. This result indicates that the Fermi surface nesting causes the area of the broken time-reversal superconducting phase to extend to a smaller thickness region in the thickness-temperature phase diagram. (C) 2015 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license.
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页码:25 / 28
页数:4
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