Power-switching applications beyond silicon: Status and future prospects of SiC and GaN devices

被引:55
|
作者
Dimitrijev, Sima [1 ]
Han, Jisheng [1 ]
Moghadam, Hamid Amini [1 ,2 ]
Aminbeidokhti, Amirhossein [1 ,2 ]
机构
[1] Griffith Univ, Queensland Micro & Nanotechnol Ctr, Nathan, Qld 4111, Australia
[2] Griffith Univ, Griffith Sch Engn, Nathan, Qld 4111, Australia
关键词
PATTERNED SAPPHIRE; CHANNEL MOBILITY; ALGAN/GAN HEMT; ON-RESISTANCE; MOS-HEMT; VOLTAGE; MODE; PERFORMANCE; GROWTH;
D O I
10.1557/mrs.2015.89
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article reviews the development of SiC and GaN devices for power-switching applications in the context of four specifically identified application requirements: (1) high-blocking voltage, (2) high-power efficiency, (3) high-switching speed, and (4) normally OFF operation. Specific device and material characteristics, such as ON resistance, parasitic capacitances, and energy-gap values, are compared and discussed in relation to the identified application requirements. Following a review of the fundamental limitations of silicon as a material, this article describes the material advantages that motivated the development of commercially available Schottky diodes and transistors using SiC. The last section analyzes the potential of GaN to enable further technical progress beyond the theoretical limit of Si and to significantly reduce the cost of power-electronic switches.
引用
收藏
页码:399 / 405
页数:7
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