Application of a trace formula to the spectra of flat three-dimensional dielectric resonators

被引:10
|
作者
Bittner, S. [1 ]
Bogomolny, E. [2 ]
Dietz, B. [1 ]
Miski-Oglu, M. [1 ]
Richter, A. [1 ,3 ]
机构
[1] Tech Univ Darmstadt, Inst Kernphys, D-64289 Darmstadt, Germany
[2] Univ Paris 11, CNRS, LPTMS, UMR8626, F-91405 Orsay, France
[3] ECT, I-38123 Villazano, Trento, Italy
来源
PHYSICAL REVIEW E | 2012年 / 85卷 / 02期
关键词
OPTICAL MICROCAVITIES; MICRODISK; RESONANCES;
D O I
10.1103/PhysRevE.85.026203
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The length spectra of flat three-dimensional dielectric resonators of circular shape were determined from a microwave experiment. They were compared to a semiclassical trace formula obtained within a two-dimensional model based on the effective index of refraction approximation and a good agreement was found. It was necessary to take into account the dispersion of the effective index of refraction for the two-dimensional approximation. Furthermore, small deviations between the experimental length spectrum and the trace formula prediction were attributed to the systematic error of the effective index of refraction approximation. In summary, the methods developed in this article enable the application of the trace formula for two-dimensional dielectric resonators also to realistic, flat three-dimensional dielectric microcavities and -lasers, allowing for the interpretation of their spectra in terms of classical periodic orbits.
引用
收藏
页数:12
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