Photorefractive CdTe:Ge as a medium for laser ultrasonics detection

被引：0
|
作者：
Klein, MB [1 ]
Shcherbin, K [1 ]
Danylyuk, V [1 ]
机构：
[1] Lasson Technol Inc, Culver City, CA 90230 USA
来源：
Photorefractive Effects, Materials, and Devices, Proceedings Volume | 2003年 / 87卷
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Photorefractive CdTe:Ge crystals are studied as a medium for laser ultrasonic detection at 1.06 mu m and 1.55 mu m. The complex coupling strength is estimated for the two-beam coupling configuration in the presence of a dc field. Excellent performance of the material is shown at both wavelengths by demonstration of high sensitivity and high cutoff frequency at low intensity. Different adaptive interferometers based on two-wave mixing, polarization self-modulation and vectorial wave mixing are realized in the same crystal. The sensitivities of these interferometers are compared.
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页码：483 / 489
页数：7
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