Metalorganic vapor phase epitaxial growth parameter dependence of phase separation in miscibility gap of InGaAsP
被引:5
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作者:
Ono, Kenichi
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Mitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, JapanMitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, Japan
Ono, Kenichi
[1
]
Takemi, Masayoshi
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Mitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, JapanMitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, Japan
Takemi, Masayoshi
[1
]
Fujiwara, Yasufumi
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Osaka Univ, Grad Sch Engn, Div Mat & Mfg Sci, Suita, Osaka 5650871, JapanMitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, Japan
Fujiwara, Yasufumi
[2
]
机构:
[1] Mitsubishi Electr Corp, High Frequency & Opt Device Works, Itami, Hyogo 6648641, Japan
[2] Osaka Univ, Grad Sch Engn, Div Mat & Mfg Sci, Suita, Osaka 5650871, Japan
The generation mechanism of the immiscibility of InGaAsP grown by metalorganic vapor phase epitaxy (MOVPE) is investigated. The growth condition dependence of the immiscibility is examined in detail using particular photoluminescence (PL) characteristics observed in the boundary composition between stable and unstable compositional regions. A lower growth rate or a larger V/III ratio is effective for suppressing phase separation. To explain this growth condition dependence, some factors related to surface energy should be taken into consideration.