Activation of Ultrathin Oxide Films for Chemical Reaction by Interface Defects

被引：37
|
作者：
Jung, Jaehoon [1 ,2 ]
Shin, Hyung-Joon [1 ]
Kim, Yousoo [1 ]
Kawai, Maki [2 ]
机构：
[1] RIKEN Adv Sci Inst, Wako, Saitama 3510198, Japan
[2] Univ Tokyo, Dept Adv Mat Sci, Chiba 2778561, Japan
来源：
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2011年 / 133卷 / 16期
关键词：
NO2; ADSORPTION; THIN-FILMS; WATER; CO; DISSOCIATION; THICKNESS; CATALYSIS; OXIDATION; STATE;
D O I：
10.1021/ja200854g
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Periodic density functional theory calculations revealed strong enhancement of chemical reactivity by defects located at the oxide-metal interface for water dissociation on ultrathin MgO films deposited on Ag(100) substrate. Accumulation of charge density at the oxide-metal interface due to irregular interface defects influences the chemical reactivity of MgO films by changing the charge distribution at the oxide surface. Our results reveal the importance of buried interface defects in controlling chemical reactions on an ultrathin oxide film supported by a metal substrate.
引用
收藏
页码：6142 / 6145
页数：4
相关论文
共 50 条
  • [1] CHEMICAL-STRUCTURE OF ULTRATHIN SILICON-OXIDE FILMS AND THE OXIDE SILICON INTERFACE
    HATTORI, T
    THIN SOLID FILMS, 1991, 206 (1-2) : 1 - 5
  • [2] The physical and chemical properties of ultrathin oxide films
    Street, SC
    Xu, C
    Goodman, DW
    ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1997, 48 : 43 - 68
  • [3] Chemical Defects in Ultrathin NiO Films on Ag(001)
    Yang, Seolun
    Kim, J. -S.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2010, 56 (02) : 659 - 665
  • [4] INTERFACE DEFECTS OF ULTRATHIN RAPID-THERMAL OXIDE ON SILICON
    STATHIS, JH
    BUCHANAN, DA
    QUINLAN, DL
    PARSONS, AH
    KOTECKI, DE
    APPLIED PHYSICS LETTERS, 1993, 62 (21) : 2682 - 2684
  • [5] Chemisorption and chemical reaction effects on the resistivity of ultrathin gold films at the liquid-solid interface
    Zhang, YM
    Terrill, RH
    Bohn, PW
    ANALYTICAL CHEMISTRY, 1999, 71 (01) : 119 - 125
  • [6] Defects in oxide ultrathin films and 2D materials
    Netzer, Falko P.
    Surnev, Svetlozar
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2025, 37 (18)
  • [7] Mechanisms of epitaxy and defects at the interface in ultrathin YSZ films on Si(001)
    de Coux, Patricia
    Bachelet, Romain
    Gatel, Christophe
    Warot-Fonrose, Benedicte
    Fontcuberta, Josep
    Sanchez, Florencio
    CRYSTENGCOMM, 2012, 14 (23): : 7851 - 7855
  • [8] Ultrathin films of NiO on MgO(100): Studies of the oxide-oxide interface
    Guo, Q
    Xu, C
    Goodman, DW
    LANGMUIR, 1998, 14 (06) : 1371 - 1374
  • [9] Ultrathin films of NiO on MgO(100): Studies of the oxide-oxide interface
    Texas A&M Univ, College Station, United States
    Langmuir, 6 (1371-1374):
  • [10] Characterization of Chemical Speciation in Ultrathin Uranium Oxide Layered Films
    He, Heming
    Wang, P.
    Allred, D. D.
    Majewski, Jaroslaw
    Wilkerson, M. P.
    Rector, Kirk D.
    ANALYTICAL CHEMISTRY, 2012, 84 (23) : 10380 - 10387
12345