Indentation fracture studies of a BaTiO3 thin film on a silicon substrate

被引：0
|
作者：
Ho, WM [1 ]
Fu, R [1 ]
Wan, KT [1 ]
Chou, J [1 ]
Zhang, TY [1 ]
机构：
[1] HONG KONG UNIV SCI & TECHNOL,CTR ADV ENGN MAT,DEPT MECH ENGN,KOWLOON,HONG KONG
来源：
POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES, AND APPLICATIONS II | 1996年 / 403卷
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D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
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页码：241 / 246
页数：6
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