Precision atomic beam density characterization by diode laser absorption spectroscopy (vol 87, 093103, 2016)

被引：0
|
作者：
Oxley, Paul [1 ]
Wihbey, Joseph [1 ]
机构：
[1] Coll Holy Cross, Dept Phys, Worcester, MA 01610 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2020年 / 91卷 / 04期
关键词：
D O I：
10.1063/5.0009288
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页数：1
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