LEED structure determination of the Ni(111)(√3 x √3)R30°-Sn surface

被引：21
|
作者：
Soares, EA
Bittencourt, C
Lopes, EL
de Carvalho, VE
Woodruff, DP [1 ]
机构：
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[2] Univ Fed Minas Gerais, ICEX, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil
来源：
SURFACE SCIENCE | 2004年 / 550卷 / 1-3期
基金：
英国工程与自然科学研究理事会;
关键词：
low energy electron diffraction (LEED); surface structure; morphology; roughness; and topography; surface relaxation and reconstruction; alloys; nickel; tin; low index single crystal surfaces;
D O I：
10.1016/j.susc.2003.12.027
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Quantitative low energy electron diffraction has been used to determine the structure of the Ni(1 1 1)(root3 x root3)R30degrees-Sn surface phase. The results confirm that the surface layer comprises a substitutional alloy of composition Ni2Sn as previously found by low energy ion scattering (LEIS), and also shows that there is no stacking fault at the substrate/ alloy interface as has been found in (root3 x root3)R30degrees-Sb surface alloys on Ag and Cu(1 1 1). The surface alloy layer is rumpled with the Sri atoms 0.45 +/- 0.03 Angstrom higher above the substrate than the surrounding Ni atoms. This rumpling amplitude is almost identical to that previously reported on the basis of the LEIS study. Comparison with similar results for Sn-induced surface alloy phases on Ni(1 0 0) and Ni(1 1 0) shows a clear trend to reduced rumpling with reduced surface atomic layer density, an effect which can be rationalised in terms of the different effects of valence electron charge smoothing at the surface. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码：127 / 132
页数：6
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