The Non-destructive Measurement Instrument for Material Thickness

被引：2
|
作者：
Ding, Shoucheng [1 ,2 ]
Li, Wenhui [1 ]
Yuan, Guici
机构：
[1] Lanzhou Univ Technol, Coll Elect & Informat Engn, Lanzhou, Gansu, Peoples R China
[2] Key Lab Gansu Adv Control Ind Proc, Lanzhou, Gansu, Peoples R China
来源：
MATERIALS ENGINEERING FOR ADVANCED TECHNOLOGIES, PTS 1 AND 2 | 2011年 / 480-481卷
关键词：
Material thickness; ultrasonic; AT89C51; microcontroller; non-destructive testing;
D O I：
10.4028/www.scientific.net/KEM.480-481.415
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In a variety of materials, the ultrasonic propagation velocity is different. Using ultrasonic reflection principle in the material, the measuring instrument detected the thickness of the measured object. AT89C51 microcontroller as the system core, with ultrasonic probe, transmitter circuit, receiver circuit, counter circuit, LCD display circuit together, completed the measurement of materials thickness. The measurement range was up to a 1.2 similar to 200mm. Practice shows that the instrument is low cost, high speed, high precision, reliability, adaptability, etc. So it has broad application prospects.
引用
收藏
页码：415 / +
页数：2
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