Electronic properties of the graphene/6H-SiC(000(1)over-bar) interface: A first-principles study
被引:25
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作者:
Jayasekera, Thushari
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机构:
N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USAN Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
Jayasekera, Thushari
[1
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Xu, Shu
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N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USAN Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
Xu, Shu
[1
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Kim, K. W.
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N Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USAN Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
Kim, K. W.
[2
]
Nardelli, M. Buongiorno
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N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
Oak Ridge Natl Lab, Div Math & Comp Sci, Oak Ridge, TN 37831 USAN Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
Nardelli, M. Buongiorno
[1
,3
]
机构:
[1] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[2] N Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
[3] Oak Ridge Natl Lab, Div Math & Comp Sci, Oak Ridge, TN 37831 USA
Using calculations from first principles, we show how the structural and electronic properties of epitaxial graphene on 6H-SiC(000 (1) over bar) are determined by the geometry and the chemical functionalization of the interface region. We also demonstrate that these properties can be correctly captured only if a proper treatment of the van der Waals interactions is included in the theoretical description based on density functional theory. Our results reproduce the experimentally observed n-type doping of monolayer epitaxial graphene and prove the possibility of opening a sizable (150 meV) energy gap in the bilayer case under special growth conditions. Depending on the details of the bonding at the interface, we are able to interpret recent experimental observations and provide a clear insight into the mechanisms of charge transfer and interface stability.
机构:
Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA
Sprinkle, M.
Hicks, J.
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Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA
Hicks, J.
Tejeda, A.
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机构:
Univ Nancy UPV Metz, CNRS, Inst Jean Lamour, F-54506 Vandoeuvre Les Nancy, France
Synchrotron SOLEIL, F-91192 Gif Sur Yvette, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Tejeda, A.
Taleb-Ibrahimi, A.
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CNRS, Synchrotron SOLEIL, UR1, F-91192 Gif Sur Yvette, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Taleb-Ibrahimi, A.
Le Fevre, P.
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Synchrotron SOLEIL, F-91192 Gif Sur Yvette, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Le Fevre, P.
Bertran, F.
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Synchrotron SOLEIL, F-91192 Gif Sur Yvette, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Bertran, F.
Tinkey, H.
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Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA
Tinkey, H.
Clark, M. C.
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Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA
Clark, M. C.
Soukiassian, P.
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机构:
CEA, SIMA, DSM IRAMIS SPCSI, F-91191 Gif Sur Yvette, France
Univ Paris 11, Dept Phys, F-91405 Orsay, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Soukiassian, P.
Martinotti, D.
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机构:
CEA, SIMA, DSM IRAMIS SPCSI, F-91191 Gif Sur Yvette, FranceGeorgia Inst Technol, Atlanta, GA 30332 USA
Martinotti, D.
Hass, J.
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Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA
Hass, J.
Conrad, E. H.
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机构:
Georgia Inst Technol, Atlanta, GA 30332 USAGeorgia Inst Technol, Atlanta, GA 30332 USA