The E-J characteristics of MgB2 thin film prepared by electron beam evaporation method

被引:0
|
作者
Haruta, M
Fujiyoshi, T
Sueyoshi, T
Miyahara, K
Doi, T
Kitaguchi, H
机构
[1] Kumamoto Univ, Dept Elect & Comp Engn, Kumamoto 8608555, Japan
[2] Kagoshima Univ, Dept Elect & Elect Engn, Kagoshima 8900065, Japan
[3] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan
关键词
MgB2 thin film; E-J characteristics; pinning parameters;
D O I
10.1016/j.physc.2005.03.027
中图分类号
O59 [应用物理学];
学科分类号
摘要
The E-J characteristics of MgB2 thin film prepared by the electron beam evaporation method were investigated. The film has a fairly higher T-c of 35 K and J(c) of 0.48 MA/cm(2) at 20 K and 1 T among as-grown MgB2 films prepared by various methods. The E-J characteristics at various temperatures and magnetic fields can be described by the percolation transition model. The pinning parameters and the distribution of pinning forces of the MgB2 thin film were estimated. It was found that the MgB2 thin film has the uniform distribution of pinning forces by grain boundaries. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:174 / 178
页数:5
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