Investigation of CVD Grown Graphene Topography

被引：7

作者：

Botti, Sabina ^{[1
]}

Rufoloni, Alessandro ^{[1
]}

Vannozzi, Angelo ^{[1
]}

Gay, Stefano ^{[2
]}

机构：

[1] ENEA, Fus & Technol Nucl Safety & Secur Dept, Via Enrico Fermi 45, I-00044 Frascati, Italy

[2] Horiba Italia Srl, Via L Gaur 209, I-00143 Rome, Italy

来源：

NANOINNOVATION 2017 | 2018年 / 1990卷

关键词：

RAMAN-SPECTROSCOPY; FILMS;

D O I：

10.1063/1.5047761

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this work, we combined AFM, FE-SEM and Raman spectroscopy to study the commercially available CVD grown graph on Cu and Si substrate. SEM and AFM provide topographic information, show a network of out of plane deformations, 'wrinkles', whereas Raman spectroscopy which can give infonnation on structural properties of the graphene films, such as the number of layers and level of disorder, by observing the peaks, indicates a I-2D/I-G ratio smaller than the value expected for mono-layer graphene.

引用

页数：6

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