Properties and microstructures of epoxy resin/TiO2 and SiO2 hybrids

被引:15
|
作者
Yano, S [1 ]
Ito, T [1 ]
Shinoda, K [1 ]
Ikake, H [1 ]
Hagiwara, T [1 ]
Sawaguchi, T [1 ]
Kurita, K [1 ]
Seno, M [1 ]
机构
[1] Nihon Univ, Coll Sci & Technol, Chiyoda Ku, Tokyo 1018308, Japan
关键词
epoxy resin hybrid; SiO2; TiO2; dynamic viscoelasticity; small-angle X-ray scattering;
D O I
10.1002/pi.1687
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Epoxy resin/TiO2 and epoxy resin/SiO2 hybrids were prepared by different procedures, and their mechanical properties were correlated to their microstructures, as indicated by small-angle X-ray scattering (SAXS) measurements. Epoxy resin/TiO2 hybrids were prepared by mixing the epoxy resin (EP828) with N-(2-aminoethyl)-3-aminopropyltrimethoxysilane (S320) in acetone, and then titanium-n-butoxide (TnBU) was added. In addition, epoxy/SiO2 hybrids were prepared by mixing EP828 with a curing agent, a diamino heterocyclic compound (13002) in acetone, and an organo silica sol (silica nanoparticles dispersed in methylethylketone) was added. In the EP828/S320/TiO2 hybrid systems, the TiO2 component was attached to both of the chain ends of the epoxy matrix, hence leading to the formation of inorganic domains via the covalent bonds. SAXS profiles of these hybrids showed peaks at q = 2.3 nm(-1), caused by interference between the domains. The storage modulus increased with increasing TiO2 content above the T-g, owing to the strong interactions between TiO2 and the epoxy matrix. The tan delta peak position did not change, although the intensity decreased with increasing TiO2 content. The SAXS profiles of the EP828/B002/SiO2 hybrids were very different to those of the corresponding EP828/S320/TiO2 hybrids, and indicated that SiO2 particles with rough surfaces were randomly dispersed in the epoxy matrix. The storage moduli of the EP828/B002/SiO2 hybrid systems increased only slightly with SiO2 content, because of the weak interactions. These mechanical properties are well explained by the microstructures derived from the SAXS profiles. (C) 2004 Society of Chemical Industry.
引用
收藏
页码:354 / 361
页数:8
相关论文
共 50 条
  • [41] Effects of SiO2 Nanofiller on the Properties of Epoxy Resin Based Syntactic Foam
    Strauchs, Anja
    Mashkin, Andrey
    Schnettler, Armin
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2012, 19 (02) : 400 - 407
  • [42] The effect of SiO2 nano-filler on dielectric properties of epoxy resin
    Kudelcik, Jozef
    Jahoda, Emil
    Kurimsky, Juraj
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2019, 85 (01):
  • [43] Preparation of monodisperse SiO2/TiO2/SiO2 multiply coated submicrospheres
    Li, QY
    Dong, P
    Liu, RX
    Bai, YQ
    JOURNAL OF INORGANIC MATERIALS, 2001, 16 (05) : 896 - 902
  • [44] Characterization of protective performance of epoxy reinforced with nanometer-sized TiO2 and SiO2
    Shi, Hongwei
    Liu, Fuchun
    Yang, Lihong
    Han, Enhou
    PROGRESS IN ORGANIC COATINGS, 2008, 62 (04) : 359 - 368
  • [45] Evaluation of Coefficient of Thermal Expansion and Relative Permittivity of TiO2/SiO2 Epoxy Composite
    Ozaki, Hiroya
    Kurimoto, Muneaki
    Sawada, Toru
    Funabashi, Toshihisa
    Kato, Takeyoshi
    Suzuoki, Yasuo
    2017 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS (ISEIM), VOLS 1 & 2, 2017, : 146 - 148
  • [46] Studies on physicochemical properties of TiO2/SiO2 and 1%Pt/TiO2/SiO2 photocatalysts in the reduction of CO2 in H2O to methanol
    Nalepa, Klaudia
    Goralski, Jacek
    Szynkowska, Malgorzata I.
    Rynkowski, Jacek
    PRZEMYSL CHEMICZNY, 2010, 89 (04): : 500 - 504
  • [47] MUF resin incorporating SiO2 and TiO2 nanoparticles: characterization and performance as a plywood adhesive
    Wei, Zhenyu
    Kong, Xiangnan
    Jia, Bin
    Xia, Shitao
    Han, Shuguang
    EUROPEAN JOURNAL OF WOOD AND WOOD PRODUCTS, 2024, 82 (03) : 797 - 808
  • [48] Functional SiO2–TiO2–PEG hybrid resin by direct chelation with catecholic compound
    Lan-Young Hong
    Tae-Ho Yoon
    Hyang-Im Ryoo
    Sang-Hee Jung
    Dong-Pyo Kim
    Journal of Sol-Gel Science and Technology, 2011, 57 : 279 - 286
  • [50] Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer
    Cetin, Saime Sebnem
    Efkere, Halil Ibrahim
    Sertel, Tunc
    Tataroglu, Adem
    Ozcelik, Suleyman
    SILICON, 2020, 12 (12) : 2879 - 2883