Dark-field Z-scan imaging technique

被引：7

作者：

Wang, Hongzhen ^{[1
]}

Cassagne, Christophe ^{[1
]}

Leblond, Herve ^{[1
]}

Boudebs, Georges ^{[1
]}

机构：

[1] Univ Angers, LUNAM Univ, LPhiA, Lab Photon Angers,EA 4464, F-49045 Angers 01, France

来源：

OPTICS COMMUNICATIONS | 2016年 / 366卷

关键词：

Z-scan; Dark-field microscopy; Third-order nonlinearity; Phase object; OPTICAL NONLINEARITIES; D4-SIGMA METHOD; SINGLE-BEAM; REFRACTION;

D O I：

10.1016/j.optcom.2015.12.035

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report on Dark-Field Z-scan (DFZ-scan) as a new imaging technique combining Z-scan method with Dark-field microscopy in order to measure optical refraction nonlinearity. Numerical and experimental results are provided to validate this concept. The image of the induced phase shift is spatially resolved without introducing a complex interferometric setup. Moreover, the experimental results show almost 3 times increase of the sensitivity when compared to the conventional Z-scan method. New perspective of microscope laser scanning is introduced. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：148 / 153

页数：6

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