Analyzing Technology Development Trend Based on Patent Data

被引：0

作者：

Hao, Xinning ^{[1
]}

Xie, Nengfu ^{[1
]}

Sun, Wei ^{[1
]}

机构：

[1] Chinese Acad Agr Sci, Agr Informat Inst, Beijing, Peoples R China

来源：

2016 3RD INTERNATIONAL CONFERENCE ON SYSTEMS AND INFORMATICS (ICSAI) | 2016年

关键词：

patent data mining; technology evolution; knowledge transfer; citation analysis; NANOTECHNOLOGY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Patents embody both fundamental researches and technologies, while patent analysis can reflect the technological development trend, grasp the competitive situation of technical subjects effectively, and track technical competitions among countries rapidly. In this paper, a patent data mining method is designed, covering five parts, including the data acquisition, data pre-processing, core dataset construction, network construction and visualization analysis. Besides, technological development trend can be analyzed. Finally, the patent data of soybean breeding techniques is selected for instance analysis.

引用

页码：1056 / 1061

页数：6

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