Stability of microcrystalline silicon for thin film solar cell applications

被引:72
|
作者
Finger, F
Carius, R
Dylla, T
Klein, S
Okur, S
Günes, M
机构
[1] Forschungszentrum Julich, Inst Photovoltaics, D-52425 Julich, Germany
[2] Izmir Inst Technol, Dept Phys, TR-35437 Izmir, Turkey
来源
关键词
D O I
10.1049/ip-cds:20030636
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The development of microcrystalline silicon (muc-Si:H) for solar cells has made good progress with efficiencies better than those of amorphous silicon (a-Si:H) devices. Of particular interest is the absence of light-induced degradation in highly crystalline muc-Si:H. However, the highest efficiencies are obtained with material which may still include a-Si:H regions and light-induced changes may be expected in such material. On the other hand, material of high crystallinity is susceptible to in-diffusion of atmospheric gases which, through adsorption or oxidation, affect the electronic transport. Investigations are presented of such effects concerning the stability of muc-Si:H films and solar cells prepared by plasma-enhanced chemical vapour deposition and hot wire chemical vapour deposition.
引用
收藏
页码:300 / 308
页数:9
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