PVD processes: Rutherford backscattering spectrometry

被引:0
|
作者
Mattox, DM
机构
来源
PLATING AND SURFACE FINISHING | 1996年 / 83卷 / 05期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:134 / &
页数:2
相关论文
共 50 条
  • [21] Investigation of the morphology of porous silicon by Rutherford backscattering spectrometry
    Szilagyi, E.
    Hajnal, Z.
    Paszti, F.
    Buiu, O.
    Craciun, G.
    Cobianu, C.
    Savaniu, C.
    Vazsonyi, E.
    Materials Science Forum, 1997, 248-249 : 373 - 376
  • [22] Investigation of the morphology of porous silicon by Rutherford Backscattering Spectrometry
    Szilagyi, E
    Hajnal, Z
    Paszti, F
    Buiu, O
    Craciun, G
    Cobianu, C
    Savaniu, C
    Vazsonyi, E
    MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES, 1997, 248-2 : 373 - 376
  • [23] Characterization of ultra thin layers by Rutherford Backscattering Spectrometry
    Brijs, B
    Deleu, J
    Connard, T
    Li, H
    Loo, R
    Caymax, M
    Nakajima, K
    Kimura, K
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 1999, 99 (16): : 160 - 169
  • [24] ANALYSIS OF PHOTOGRAPHIC-EMULSIONS BY RUTHERFORD BACKSCATTERING SPECTROMETRY
    ROLLINS, DK
    LEAVITT, JA
    FERNANDO, Q
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 188 (AUG): : 102 - ANYL
  • [25] The characterization of asymmetric alumina membranes by Rutherford backscattering spectrometry
    Pesiri, DR
    Snow, RC
    Elliott, N
    Maggiore, C
    Dye, RC
    JOURNAL OF MEMBRANE SCIENCE, 2000, 176 (02) : 209 - 221
  • [26] Diffusion of Sr in fluorphlogopite determined by Rutherford backscattering spectrometry
    Hammouda, T
    Cherniak, DJ
    EARTH AND PLANETARY SCIENCE LETTERS, 2000, 178 (3-4) : 339 - 349
  • [27] Photoluminescence mapping and Rutherford Backscattering Spectrometry of InGaN epilayers
    O'Donnell, KP
    White, ME
    Pereira, S
    Wu, MF
    Vantomme, A
    Van der Stricht, W
    Jacobs, K
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1999, 216 (01): : 171 - 174
  • [28] NiTi thin film characterization by Rutherford backscattering spectrometry
    Goldberg, F
    Knystautas, EJ
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1996, 40 (2-3): : 185 - 189
  • [29] Thin-film morphology and Rutherford backscattering spectrometry
    Hahn, T
    Metzner, H
    Gossla, M
    Conrad, J
    MATERIALS SCIENCE APPLICATIONS OF ION BEAM TECHNIQUES, 1997, 248-2 : 409 - 412
  • [30] Interpretation of electron Rutherford backscattering spectrometry for hydrogen quantification
    Alvarez, Rafael
    Yubero, Francisco
    SURFACE AND INTERFACE ANALYSIS, 2014, 46 (10-11) : 812 - 816