Determination of the analytical point spread function of a pinhole aperture SPECT system

被引：0

作者：

Bekaert, V ^{[1
]}

Brasse, D ^{[1
]}

Gizard, B ^{[1
]}

Guyonnet, JL ^{[1
]}

机构：

[1] Inst Rech Subatom, F-67037 Strasbourg, France

来源：

2004 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-7 | 2004年

关键词：

D O I：

暂无

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Pinhole aperture in single photon emission computed tomography (SPECT) imaging system provides high spatial resolution for quantitative measurement. In this paper, we propose a new analytical method to calculate the PSF of a pinhole SPECT system where the response of the crystal is taken into account. The PSF is calculated as the convolution of the pinhole and the crystal responses. A general method to calculate the pinhole response is introduced using a decomposition of the pinhole geometry in single mathematical elements. The crystal response is derived analytically using the distribution of the optical photons on the photodetector surface. As a conclusion, both the pinhole response and the optical distribution give similar results compared to the one obtained with Monte Carlo simulation for a reduced computing time.

引用

页码：2565 / 2569

页数：5

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