2D reflectometry for the investigation of polymer interfaces: off-specular neutron scattering

被引:1
|
作者
Hafner, Aljosa [1 ,2 ,5 ]
Gutfreund, Philipp [1 ]
Toperverg, Boris P. [1 ,3 ]
Geoghegan, Mark [4 ,6 ]
Sferrazza, Michele [2 ]
机构
[1] Inst Laue Langevin, 71 Ave Martyrs,CS 20156, F-38042 Grenoble 9, France
[2] Univ Libre Bruxelles, Dept Phys, B-1050 Brussels, Belgium
[3] Kurchatov Inst, Natl Res Ctr, Petersburg Nucl Phys Inst, Gatchina 188300, Russia
[4] Univ Sheffield, Dept Phys & Astron, Hicks Bldg,Hounsfield Rd, Sheffield S3 7RH, S Yorkshire, England
[5] CERIC ERIC, I-34149 Trieste, Italy
[6] Newcastle Univ, Sch Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
关键词
neutron reflectometry; off-specular scattering; thin polymer films; distorted-wave Born approximation; X-RAY REFLECTIVITY; CAPILLARY WAVES; FILMS; FLUCTUATIONS; DYNAMICS;
D O I
10.1088/1361-648X/ac0282
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Specular and off-specular neutron reflectometry have been used in a combined approach to study thin polymer films. Our goal in this work is to illustrate the power of the off-specular scattering technique to probe the properties of the buried interface of immiscible polymer bilayers of deuterated polystyrene and protonated poly(methyl methacrylate) (h-PMMA). The diffuse scattering stemming from these systems is discussed in relation to thermal fluctuations at the polymer/polymer interface, providing a means to extract in-plane correlation lengths from buried interfaces. In addition the onset of hole formation in the top layer is evidenced by the diffuse scattering, not easily detectable by specular reflection alone.
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收藏
页数:9
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