2D reflectometry for the investigation of polymer interfaces: off-specular neutron scattering

被引：1

作者：

Hafner, Aljosa ^{[1
,2
,5
]}

Gutfreund, Philipp ^{[1
]}

Toperverg, Boris P. ^{[1
,3
]}

Geoghegan, Mark ^{[4
,6
]}

Sferrazza, Michele ^{[2
]}

机构：

[1] Inst Laue Langevin, 71 Ave Martyrs,CS 20156, F-38042 Grenoble 9, France

[2] Univ Libre Bruxelles, Dept Phys, B-1050 Brussels, Belgium

[3] Kurchatov Inst, Natl Res Ctr, Petersburg Nucl Phys Inst, Gatchina 188300, Russia

[4] Univ Sheffield, Dept Phys & Astron, Hicks Bldg,Hounsfield Rd, Sheffield S3 7RH, S Yorkshire, England

[5] CERIC ERIC, I-34149 Trieste, Italy

[6] Newcastle Univ, Sch Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 2021年 / 33卷 / 36期

关键词：

neutron reflectometry; off-specular scattering; thin polymer films; distorted-wave Born approximation; X-RAY REFLECTIVITY; CAPILLARY WAVES; FILMS; FLUCTUATIONS; DYNAMICS;

D O I：

10.1088/1361-648X/ac0282

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Specular and off-specular neutron reflectometry have been used in a combined approach to study thin polymer films. Our goal in this work is to illustrate the power of the off-specular scattering technique to probe the properties of the buried interface of immiscible polymer bilayers of deuterated polystyrene and protonated poly(methyl methacrylate) (h-PMMA). The diffuse scattering stemming from these systems is discussed in relation to thermal fluctuations at the polymer/polymer interface, providing a means to extract in-plane correlation lengths from buried interfaces. In addition the onset of hole formation in the top layer is evidenced by the diffuse scattering, not easily detectable by specular reflection alone.

引用

页数：9

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