Form-birefringence simulation: different approaches comparison

In this paper we compare different effective medium approximations that are widely used for refractive index and birefringence simulation in 2d nanostructures with plane-wave expansion approach which is considered and proved to be absolutely correct. It is estimated independence of the result of extraordinary refractive index (for TM-polarization) simulation on the method. Calculations carried out for model porous alumina film demonstrate the best agreement between results of plane-wave expansion method and Maxwell-Garnett theory. For Bruggeman approximation and Boundary conditions model applicability regions have been clarified at the porosity scale.