Joint statistical design of double sampling (X)over-bar and s charts

被引:54
|
作者
He, D [1 ]
Grigoryan, A [1 ]
机构
[1] Univ Illinois, Dept Mech & Ind Engn, Chicago, IL 60607 USA
关键词
statistical quality control; double sampling; joint statistical design; genetic algorithm;
D O I
10.1016/j.ejor.2004.04.033
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
In statistical quality control, usually the mean and variance of a manufacturing process are monitored jointly by two statistical control charts, e.g., a (X) over bar chart and a R chart. Because of the efficiency of double sampling (DS) (X) over bar charts in detecting shifts in process mean and DS s charts in process standard deviation it seems reasonable to investigate the joint DS (X) over bar and s charts for statistical quality control. In this paper, a joint DS X and s chart scheme is proposed. The statistical design of the joint DS T and s charts is defined and formulated as an optimization problem and solved using a genetic algorithm. The performance of the joint DS (X) over bar and s charts is also investigated. The results of the investigation indicate that the joint DS (X) over bar and s charts offer a better statistical efficiency in terms of average run length (ARL) than combined EWMA and CUSUM schemes, omnibus EWMA scheme over certain shift ranges when all schemes are optimized to detect certain shifts. In comparison with the joint standard, two-stage samplings and variable sampling size (X) over bar and R charts, the joint DS charts offer a better statistical efficiency for all ranges of the shifts. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:122 / 142
页数:21
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