The statistical performance of double sampling (X)over-bar control charts for correlation data

被引：2

作者：

Lee, Pei-Hsi ^{[1
]}

Torng, Chau-Chen ^{[2
]}

Liao, Huang-Sheng ^{[2
]}

Tseng, Chun-Chieh ^{[2
]}

机构：

[1] Cheng Shiu Univ, Dept Business Adm, Kaohsiung Cty, Taiwan

[2] Natl Yunlin Univ Sci & Technol, Inst Ind Engn & Management, Yunlin, Taiwan

来源：

2009 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT, VOLS 1-4 | 2009年

关键词：

double sampling (X)over-bar chart; variable parameters (X)over-bar charts; correlated data; VARIABLE PARAMETERS; GENETIC ALGORITHMS; DESIGN;

D O I：

10.1109/IEEM.2009.5373536

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Double sampling (X) over bar control chart (DS) which is a Shewhart-type chart can reduce sample size and detect small process shift fast. In real industries, process observations may be interdependent and correlated, and the statistical performance of DS (X) over bar chart for the correlated data need to be re-evaluated. This article constructs the calculations of statistical indices of DS (X) over bar charts for correlation data and performs a comparative study for investigating the performance distinction of DS (X) over bar charts and other Shewhart-type charts. This comparative study indicates that DS -(X) over bar charts are the best choice for monitoring of correlated data.

引用

页码：955 / 959

页数：5

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