In situ monitoring of hydrogen desorption from silicon nanoparticles dispersed in a nonthermal plasma

被引:17
|
作者
Lopez, Thomas [1 ]
Mangolini, Lorenzo [2 ]
机构
[1] Univ Calif Riverside, Dept Mech Engn, Riverside, CA 92521 USA
[2] Univ Calif Riverside, Dept Mech Engn, Mat Sci & Engn Program, Riverside, CA 92521 USA
来源
基金
美国国家科学基金会;
关键词
CROSS-SECTIONS; NANOCRYSTALS; SURFACES; KINETICS; TEMPERATURE; ENERGY; PHASE; FILMS;
D O I
10.1116/1.4946839
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, the authors discuss the use of Fourier transform infrared absorption spectroscopy to monitor the hydrogen surface coverage of silicon nanoparticles suspended in an argon-hydrogen nonthermal plasma. The absorption from surface silicon hydride groups is measured by growing nanoparticles from silane in a first plasma reactor and by passing them through a second plasma reactor intersected by an infrared beam. Using this setup, the authors obtain an in situ, in-flight measurement of the surface termination. They have found that hydrogen surface coverage declines at increasing plasma power. Control experiments performed on particles collected onto a substrate and exposed to the same plasma indicate that the loss of hydrogen is the result of a thermally induced desorption process. By using well-established kinetic rates for hydrogen interactions with silicon surfaces, the authors estimate the nanoparticle temperature to be in the 650-750K range. This work provides additional experimental evidence that dust suspended in a low-pressure partially ionized gas is heated to a high temperature, enabling the production of high-quality nanocrystals. (C) 2016 American Vacuum Society.
引用
收藏
页数:6
相关论文
共 50 条
  • [41] In situ XRD characterization of hydrogen desorption from electrochemically deposited Pd coating
    L. Borgese
    P. Zanola
    E. Bontempi
    D. Rossi
    L. E. Depero
    Journal of Coatings Technology and Research, 2010, 7 : 691 - 695
  • [42] In situ XRD characterization of hydrogen desorption from electrochemically deposited Pd coating
    Borgese, L.
    Zanola, P.
    Bontempi, E.
    Rossi, D.
    Depero, L. E.
    JOURNAL OF COATINGS TECHNOLOGY AND RESEARCH, 2010, 7 (06) : 691 - 695
  • [43] Electroluminescence from surface oxidized silicon nanoparticles dispersed within a polymer matrix
    Ligman, Rebekah K.
    Mangolini, Lorenzo
    Kortshagen, Uwe R.
    Campbell, Stephen A.
    APPLIED PHYSICS LETTERS, 2007, 90 (06)
  • [44] Thermal desorption of hydrogen isotopes from the JET Be plasma facing components
    Avotina, Liga
    Jepu, Ionut
    Baron-Wiechec, Aleksandra
    Kresina, Michal
    Widdowson, Anna
    PHYSICA SCRIPTA, 2020, T171 (01)
  • [45] Hydrogen Adsorption/Desorption Isotherms on Supported Platinum Nanoparticles Determined by in-situ XAS and ΔXANES Analysis
    Fujita, Masami
    Yamamoto, Akira
    Tsuchiya, Naoki
    Yoshida, Hisao
    CHEMCATCHEM, 2022, 14 (05)
  • [46] In Situ Monitoring of Non-Thermal Plasma Cleaning of Surfactant Encapsulated Nanoparticles
    Li, Gengnan
    Zakharov, Dmitri N.
    Sikder, Sayantani
    Xu, Yixin
    Tong, Xiao
    Dimitrakellis, Panagiotis
    Boscoboinik, Jorge Anibal
    NANOMATERIALS, 2024, 14 (03)
  • [47] Facile synthesis of SnO2-graphene composites employing nonthermal plasma and SnO2 nanoparticles-dispersed ethanol
    Borude, Ranjit R.
    Sugiura, Hirotsugu
    Ishikawa, Kenji
    Tsutsumi, Takayoshi
    Kondo, Hiroki
    Hori, Masaru
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2019, 52 (17)
  • [48] HYDROGEN DESORPTION-KINETICS FROM MONOHYDRIDE AND DIHYDRIDE SPECIES ON SILICON SURFACES
    GUPTA, P
    COLVIN, VL
    GEORGE, SM
    PHYSICAL REVIEW B, 1988, 37 (14): : 8234 - 8243
  • [49] HYDROGEN DESORPTION FROM CRYSTALLINE SILICON AND ITS MODIFICATION DUE TO THE PRESENCE OF DISLOCATIONS
    KISIELOWSKIKEMMERICH, C
    BEYER, W
    JOURNAL OF APPLIED PHYSICS, 1989, 66 (02) : 552 - 558
  • [50] STATE-SPECIFIC STUDY OF RECOMBINATIVE HYDROGEN DESORPTION FROM SILICON SURFACES
    SHANE, SF
    KOLASINSKI, KW
    ZARE, RN
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1992, 203 : 196 - COLL