Post-correction of under-sampled analog to digital converters

被引：0

作者：

Bjorsell, Niclas ^{[1
]}

Handel, Peter ^{[2
]}

机构：

[1] Univ Gavle, ITB Elect, SE-80176 Gavle, Sweden

[2] Royal Inst Technol, Signal Proc Lab, SE-10044 Stockholm, Sweden

来源：

2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2007年

关键词：

analog to digital converters; ADC; test; measurements; under-sampling; post-correction;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Applications with wide bandwidth and high center frequencies force the analog to digital converter (ADC) to be active in a working range with less dynamic performance in relation to lower frequency bands. However using under-sampling techniques in combination with post-correction methods enable a combination of high sampling rate, wide bandwidth and low distortion. In this paper the employed dynamic post-correction is a combination of look-up tables and model based correction. The results are mainly based on measurements on a 12-bit 210 MSPS ADC. The improvement in total harmonic distortion and spurious free dynamic range are acceptable over a wide frequency range and it is robust to variations in amplitude.

引用

页码：58 / +

页数：2

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