Measurement of modulation transfer function of infrared optoelectronic detector

被引：0
|
作者：
Lei, Liu [1 ]
Bing, Chen [1 ]
机构：
[1] Nanjing Univ Sci & Technol, Sch Elect Engn & Photoelect Technol, Nanjing, Peoples R China
来源：
OPTICAL SENSING TECHNOLOGY AND APPLICATIONS | 2007年 / 6585卷
关键词：
MTF; knife-edge scanning function; line spread function; fourier transform; spatial frequency;
D O I：
10.1117/12.723336
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.
引用
收藏
页数：6
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