Single-shot laser-induced damage threshold (LIDT) of free-standing nanometer-thin diamond-like carbon (DLC) foils was measured in vacuum environment for pulse durations from 50 fs to 200 ps. It is found that, due to higher surface defects density, the LIDT of free-standing ultrathin DLC foils is lower than that of bulk DLC by a factor of 3, and the damage fluence is almost a constant of about 0.1 J/cm(2) when the pulse duration is longer than 500 fs. Different from DLC films coated on silicon wafer, the damage fluence of free-standing DLC has a weak dependence on their thickness. Based on the measurement, the damage mechanism is illustrated by virtue of the carrier population analysis, and the requirement on the temporal laser contrast when DLC targets are used in relativistic laser-plasma experiment is discussed.
机构:
Sanming Univ, Sch Resources & Chem Engn, Sanming 365004, South KoreaSanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Zhang, Jian-Han
Clark, Daniel J.
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SUNY Binghamton, Dept Phys Appl Phys & Astron, Binghamton, NY 13902 USASanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Clark, Daniel J.
Brant, Jacilynn A.
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机构:
Duquesne Univ, Dept Chem & Biochem, Pittsburgh, PA 15282 USASanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Brant, Jacilynn A.
Rosmus, Kimberly A.
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Duquesne Univ, Dept Chem & Biochem, Pittsburgh, PA 15282 USASanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Rosmus, Kimberly A.
Grima, Pedro
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Univ Los Andes, Fac Ciencias, Ctr Estudios Semicond, Dept Fis, Merida 5101, VenezuelaSanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Grima, Pedro
Lekse, Jonathan W.
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Duquesne Univ, Dept Chem & Biochem, Pittsburgh, PA 15282 USASanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Lekse, Jonathan W.
Jang, Joon, I
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机构:
Sogang Univ, Dept Phys, Seoul 04017, South KoreaSanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
Jang, Joon, I
Aitken, Jennifer A.
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Duquesne Univ, Dept Chem & Biochem, Pittsburgh, PA 15282 USASanming Univ, Sch Resources & Chem Engn, Sanming 365004, South Korea
机构:
ASML Netherlands BV, POB 324, NL-5500 AH Veldhoven, NetherlandsUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
de Vries, Gosse
Stoermer, Michael
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Helmholtz Zentrum Geesthacht, Max Planck Str 1, D-21502 Geesthacht, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Stoermer, Michael
Scholze, Frank
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Phys Tech Bundesanstalt, Abbestr 2-12, D-10587 Berlin, Germany
Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Scholze, Frank
Siewert, Frank
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Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Siewert, Frank
van de Kruijs, Robbert W. E.
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Univ Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, NetherlandsUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
van de Kruijs, Robbert W. E.
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Milov, Igor
Louis, Eric
论文数: 0引用数: 0
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Univ Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, NetherlandsUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Louis, Eric
Jacyna, Iwanna
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Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, PolandUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Jacyna, Iwanna
Jurek, Marek
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Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, PolandUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Jurek, Marek
Klinger, Dorota
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Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, PolandUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Klinger, Dorota
Nittler, Laurent
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Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, PolandUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Nittler, Laurent
Syryanyy, Yevgen
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Polish Acad Sci, Inst Phys, Al Lotnikow 32-46, PL-02668 Warsaw, PolandUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
机构:
Carl Zeiss SMT GmbH, Rudolf Eber Str 2, D-73447 Oberkochen, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Hermann, Martin
Strobel, Sebastian
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Carl Zeiss SMT GmbH, Rudolf Eber Str 2, D-73447 Oberkochen, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Strobel, Sebastian
Nienhuys, Han-Kwang
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ASML Netherlands BV, POB 324, NL-5500 AH Veldhoven, NetherlandsUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Nienhuys, Han-Kwang
Gwalt, Grzegorz
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Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Gwalt, Grzegorz
Mey, Tobias
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Laser Lab Gottingen eV, Hans Adolf Krebs Weg 1, D-37077 Gottingen, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
Mey, Tobias
Enkisch, Hartmut
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Carl Zeiss SMT GmbH, Rudolf Eber Str 2, D-73447 Oberkochen, GermanyUniv Twente, Ind Focus Grp XUV Opt, MESA Inst Nanotechnol, Drienerlolaan 5, NL-7522 NB Enschede, Netherlands
机构:
Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Talisa, Noah
Tripepi, Michael
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Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Tripepi, Michael
Harris, Brandon
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Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Harris, Brandon
Alshafey, Abdallah
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Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Alshafey, Abdallah
Krebs, Jake
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Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Krebs, Jake
Davenport, Aaron
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Colorado State Univ, Elect & Comp Engn Dept, Ft Collins, CO 80523 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Davenport, Aaron
Randel, Emmett
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Colorado State Univ, Elect & Comp Engn Dept, Ft Collins, CO 80523 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Randel, Emmett
Menoni, Carmen S.
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Colorado State Univ, Elect & Comp Engn Dept, Ft Collins, CO 80523 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Menoni, Carmen S.
Chowdhury, Enam A.
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机构:
Ohio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Ohio State Univ, Dept Mat Sci & Engn, 2041 N Coll Rd, Columbus, OH 43210 USA
Ohio State Univ, Dept Elect & Comp Engn, 2015 Neil Ave, Columbus, OH 43210 USAOhio State Univ, Dept Phys, 191 W Woodruff Ave, Columbus, OH 43210 USA
Chowdhury, Enam A.
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS 2019,
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