Single-shot laser-induced damage threshold of free-standing nanometer-thin diamond-like carbon foils

被引：3

作者：

Wang, Dahui ^{[1
,2
]}

Ma, Wenjun ^{[1
]}

Bin, Jianhui ^{[3
]}

Alinger, Klaus ^{[3
]}

Shou, Yinren ^{[1
]}

Wang, Pengjie ^{[1
]}

Liu, Jianbo ^{[1
]}

Zhu, Jungao ^{[1
]}

Cao, Zhengxuan ^{[1
]}

Mei, Zhusong ^{[1
]}

Wang, Hongyong ^{[5
]}

Lu, Haiyang ^{[1
]}

Lin, Chen ^{[1
]}

Zhao, Yanying ^{[1
]}

Schreiber, Joerg ^{[3
]}

Yan, Xueqing ^{[1
,4
]}

机构：

[1] Peking Univ, State Key Lab Nucl Phys & Technol, Beijing 100871, Peoples R China

[2] Northwest Inst Nucl Technol, State Key Lab Laser Interact Matter, Xian 710024, Shaanxi, Peoples R China

[3] Ludwig Maximilians Univ Munchen, Fak Phys, Coulombwall 1, D-85748 Garching, Germany

[4] Shanxi Univ, Collaborat Innovat Ctr Extreme Opt, Taiyuan 030006, Shanxi, Peoples R China

[5] Shanghai Univ, Sch Environm & Chem Engn, Shanghai 200444, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2018年 / 436卷

基金：

中国国家自然科学基金; 英国工程与自然科学研究理事会;

关键词：

Laser-induced damage threshold; Diamond-like carbon; Free-standing ultrathin foils; INDUCED BREAKDOWN; FILM THICKNESS; ABLATION; DIELECTRICS; NANOSECOND;

D O I：

10.1016/j.nimb.2018.08.035

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Single-shot laser-induced damage threshold (LIDT) of free-standing nanometer-thin diamond-like carbon (DLC) foils was measured in vacuum environment for pulse durations from 50 fs to 200 ps. It is found that, due to higher surface defects density, the LIDT of free-standing ultrathin DLC foils is lower than that of bulk DLC by a factor of 3, and the damage fluence is almost a constant of about 0.1 J/cm(2) when the pulse duration is longer than 500 fs. Different from DLC films coated on silicon wafer, the damage fluence of free-standing DLC has a weak dependence on their thickness. Based on the measurement, the damage mechanism is illustrated by virtue of the carrier population analysis, and the requirement on the temporal laser contrast when DLC targets are used in relativistic laser-plasma experiment is discussed.

引用

页码：18 / 21

页数：4

共 47 条

[1] Investigation of laser induced damage threshold measurement with single-shot on thin films
Liu, Zhichao
Zheng, Yi
Pan, Feng
Lin, Qi
Ma, Ping
Wang, Jian
APPLIED SURFACE SCIENCE, 2016, 382 : 294 - 301
[2] Single-shot measurement of laser-induced damage thresholds of thin film coatings
Loewenthal, F
Tommasini, R
Balmer, JE
OPTICS COMMUNICATIONS, 1998, 152 (1-3) : 168 - 174
[3] Laser-induced spallation in diamond-like carbon films
Kononenko, TV
Pimenov, SM
Kononenko, VV
Zavedeev, EV
Konov, VI
Dumitru, G
Romano, V
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 79 (03): : 543 - 549
[4] Laser-induced spallation in diamond-like carbon films
T.V. Kononenko
S.M. Pimenov
V.V. Kononenko
E.V. Zavedeev
V.I. Konov
G. Dumitru
V. Romano
Applied Physics A, 2004, 79 : 543 - 549
[5] A new method to determine laser damage threshold for thin diamond-like carbon films on silicon
Vouagner, D
Beleznai, C
Girardeau-Montaut, JP
Templier, C
Gonnord, H
DIAMOND AND RELATED MATERIALS, 2000, 9 (3-6) : 786 - 791
[6] A Study on the Laser Induced Damage of Diamond-like Carbon Film
Wu Shenjiang
Su Junhong
PRECISION ENGINEERING AND NON-TRADITIONAL MACHINING, 2012, 411 : 537 - 541
[7] Free standing diamond-like carbon thin films by PLD for laser based electrons/protons acceleration
Thema, F. T.
Beukes, P.
Ngom, B. D.
Manikandan, E.
Maaza, M.
JOURNAL OF ALLOYS AND COMPOUNDS, 2015, 648 : 326 - 331
[8] Simulations of laser-induced dynamics in free-standing thin silicon films
Zier, Tobias
Zijlstra, Eeuwe S.
Krylow, Sergej
Garcia, Martin E.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2017, 123 (10):
[9] Simulations of laser-induced dynamics in free-standing thin silicon films
Tobias Zier
Eeuwe S. Zijlstra
Sergej Krylow
Martin E. Garcia
Applied Physics A, 2017, 123
[10] Short pulse laser-induced optical damage and fracto-emission of amorphous, diamond-like carbon
Sokolowski-Tinten, K.
von der Linde, D.
Siegal, M.P.
Overmyer, D.L.
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest, 2000, : 581 - 582

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