Integration of a gate electrode into carbon nanotube devices for scanning tunneling microscopy

被引:9
|
作者
Kong, J [1 ]
LeRoy, BJ [1 ]
Lemay, SG [1 ]
Dekker, C [1 ]
机构
[1] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
关键词
D O I
10.1063/1.1883301
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a fabrication process for incorporating a gate electrode into suspended single-walled carbon nanotube structures for scanning tunneling spectroscopy studies. The nanotubes are synthesized by chemical vapor deposition directly on a metal surface. The high temperature (800 degrees C) involved in the growth process poses challenging issues such as surface roughness and integrity of the structure which are addressed in this work. We demonstrate the effectiveness of the gate on the freestanding part of the nanotubes by performing tunneling spectroscopy that reveals Coulomb blockade diamonds. Our approach enables combined scanning tunneling microscopy and gated electron transport investigations of carbon nanotubes. (C) 2005 American Institute of Physics.
引用
收藏
页码:1 / 3
页数:3
相关论文
共 50 条
  • [21] Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
    Jung, Han Sae
    Tsai, Hsin-Zon
    Wong, Dillon
    Germany, Chad
    Kahn, Salman
    Kim, Youngkyou
    Aikawa, Andrew S.
    Desai, Dhruv K.
    Rodgers, Griffin F.
    Bradley, Aaron J.
    Velasco, Jairo, Jr.
    Watanabe, Kenji
    Taniguchi, Takashi
    Wang, Feng
    Zettl, Alex
    Crommie, Michael F.
    JOVE-JOURNAL OF VISUALIZED EXPERIMENTS, 2015, (101): : 1 - 9
  • [22] Observation of single-wall carbon nanotube rings by scanning tunneling microscopy and spectroscopy
    Zha, FX
    Bertsche, G
    Croitoru, M
    Kentsch, C
    Roth, S
    Kern, DP
    CARBON, 2004, 42 (04) : 893 - 895
  • [23] Electron scattering in a multiwall carbon nanotube bend junction studied by scanning tunneling microscopy
    Tapaszto, L.
    Nemes-Incze, P.
    Osvath, Z.
    Darabont, Al.
    Lambin, Ph.
    Biro, L. P.
    PHYSICAL REVIEW B, 2006, 74 (23)
  • [24] Bilayer gate dielectric study by scanning tunneling microscopy
    Ong, Y. C.
    Ang, D. S.
    Pey, K. L.
    O'Shea, S. J.
    Goh, K. E. J.
    Troadec, C.
    Tung, C. H.
    Kawanago, T.
    Kakushima, K.
    Iwai, H.
    APPLIED PHYSICS LETTERS, 2007, 91 (10)
  • [25] High frequency scanning gate microscopy and local memory effect of carbon nanotube transistors
    Staii, C
    Johnson, AT
    NANO LETTERS, 2005, 5 (05) : 893 - 896
  • [26] Carbon nanotube tip for scanning tunneling microscope
    Mizutani, W
    Choi, N
    Uchihashi, T
    Tokumoto, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (6B): : 4328 - 4330
  • [27] Scanning tunneling spectroscopy on a carbon nanotube buckle
    Janssen, JW
    Lemay, SG
    van den Hout, M
    Mooij, M
    Kouwenhoven, LP
    Dekker, C
    ELECTRONIC PROPERTIES OF MOLECULAR NANOSTRUCTURES, 2001, 591 : 293 - 297
  • [28] Carbon nanotube tip for scanning tunneling microscope
    Mizutani, Wataru
    Choi, Nami
    Uchihashi, Takayuki
    Tokumoto, Hiroshi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (6 B): : 4328 - 4330
  • [29] In-situ scanning tunneling microscopy of carbon monoxide adsorbed on Au(111) electrode
    Shue, CH
    Yang, LYO
    Yau, SL
    Itaya, K
    LANGMUIR, 2005, 21 (05) : 1942 - 1948
  • [30] Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy
    Lee, Joon Sung
    Ryu, Sunmin
    Yoo, Kwonjae
    Kim, Jinhee
    Choi, Insung S.
    Yun, Wan Soo
    ULTRAMICROSCOPY, 2008, 108 (10) : 1045 - 1049