共 50 条
- [1] Secondary extinction used in thickness and pole density measurements of textured films by X-ray diffraction TEXTURE AND ANISOTROPY OF POLYCRYSTALS, 1998, 273-2 : 145 - 150
- [2] X-ray diffraction characterization of textured films accounting for secondary extinction EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2, 2000, 321-3 : 137 - 142
- [4] SECONDARY EXTINCTION OF X-RAY AND NEUTRON DIFFRACTION IN MOSAIC CRYSTALS ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1996, 52 : C491 - C491
- [5] Secondary extinction in cylindrical and spherical crystals for x-ray and neutron diffraction CHINESE PHYSICS LETTERS, 2001, 18 (01): : 74 - 76
- [7] Thickness measurement of thin textured films by a novel X-ray diffraction method accounting for secondary extinction APPLIED CRYSTALLOGRAPHY XX, 2007, 130 : 43 - +
- [8] Accuracy and reproducibility of X-ray texture measurements on thin films MAGNETIC AND ELECTRONIC FILMS-MICROSTRUCTURE, TEXTURE AND APPLICATION TO DATA STORAGE, 2002, 721 : 17 - 22
- [9] Rietveld texture and stress analysis of thin films by X-ray diffraction TEXTURES OF MATERIALS, PTS 1 AND 2, 2002, 408-4 : 1603 - 1608
- [10] Stress and texture analysis in thin films and coatings by X-ray diffraction ADVANCED MATERIALS FORUM III, PTS 1 AND 2, 2006, 514-516 : 1613 - 1617