Tomography reconstruction of beams extracted from an ion source

被引:3
|
作者
Saminathan, S. [1 ]
Ames, F. [1 ]
Baartman, R. [1 ]
Marchetto, M. [1 ]
Lailey, O. [2 ]
Mahon, A. [3 ]
机构
[1] TRIUMF, Vancouver, BC V6T 2A3, Canada
[2] Univ Waterloo, Waterloo, ON N2L 3G1, Canada
[3] McGill Univ, Montreal, PQ H3A 2T8, Canada
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2019年 / 90卷 / 12期
关键词
D O I
10.1063/1.5129786
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Commissioning of the CANREB (CANadian Rare isotope facility with Electron Beam ion source) system and its associated beamlines has recently begun at TRIUMF. At the head of this beamline is an ion source used to produce stable alkaline ions with energy up to 60 keV for the CANREB system. Throughout commissioning, it is essential to have a means of verifying beam quality and ensuring that the required beam parameters along the beamline are met. This is accomplished using tomography reconstruction, which consists of taking one-dimensional scans at different projections and reconstructing an image of the beam in two dimensions using the maximum entropy algorithm. Tomography enables the visualization of the shape of the beam as well as the investigation into the possible presence of aberrations. Initially, tomography reconstruction is performed by using simulated beam profiles at the measurement locations and is then performed by using measured beam profiles. Additionally, these measurements are benchmarked by fitting the initial beam parameters in our beam optics model, and the results are presented. Published under license by AIP Publishing.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Characteristics of ion beams extracted from a compact powdery sample ion source
    Wada, M
    Kasuya, T
    Sasao, M
    Kawano, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02): : 719 - 721
  • [2] Measurement of excess energies of ion beams extracted from a microwave ion source
    Sakudo, N.
    Hayashi, K.
    Yokota, J.
    Kawasaki, A.
    Ikenaga, N.
    Sakaguchi, N.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1998, 136-138 : 793 - 797
  • [3] Measurement of excess energies of ion beams extracted from a microwave ion source
    Sakudo, N
    Hayashi, K
    Yokota, J
    Kawasaki, A
    Ikenaga, N
    Sakaguchi, N
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 136 : 793 - 797
  • [4] CHARACTERISTIC PROPERTIES OF DUOPLASMATRON ION SOURCE AND EXTRACTED ION BEAMS
    GAUTHERI.G
    LEJEUNE, C
    SEPTIER, A
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (03) : C73 - &
  • [5] On Optical Properties of Ion Beams Extracted From an Electron Cyclotron Resonance Ion Source
    Mironov, V.
    Bogomolov, S.
    Bondarchenko, A.
    Efremov, A.
    Loginov, V.
    PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON ION SOURCES, 2018, 2011
  • [6] Numerical simulation of high current ion beams extracted from a MEVVA ion source
    Institute of Electronic Engineering, China Acad. of Eng. Phys., Mianyang 621900, China
    不详
    He Jishu, 2006, 2 (97-101):
  • [7] The longitudinal energy spread of ion beams extracted from an electron cyclotron resonance ion source
    Angot, J.
    Tarvainen, O.
    Chauveau, P.
    Kosonen, S. T.
    Kalvas, T.
    Thuillier, T.
    Migliore, M.
    Maunoury, L.
    JOURNAL OF INSTRUMENTATION, 2023, 18 (04)
  • [8] Study on proton fraction of beams extracted from electron cyclotron resonance ion source
    Xu, R.
    Zhao, J.
    Peng, S. X.
    Yuan, Z. X.
    Song, Z. Z.
    Yu, J. X.
    Guo, Z. Y.
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2008, 79 (02):
  • [9] Emittance measurements for high charge state ion beams extracted from the AECR-U ion source
    Wutte, D
    Leitner, MA
    Lyneis, CM
    PHYSICA SCRIPTA, 2001, T92 : 247 - 249
  • [10] Study on the energy distribution of ion beams extracted from the sputter-type negative-ion source
    Ishikawa, J
    Tsuji, H
    Takatori, T
    Gotoh, Y
    PRODUCTION AND NEUTRALIZATION OF NEGATIVE IONS AND BEAMS / PRODUCTION AND APPLICATION OF LIGHT NEGATIVE IONS, 1996, (380): : 241 - 251