A Study of Two-point Multi-section Non-uniformity Correction Auto Division Algorithm for Infrared Images

被引:2
|
作者
Zhou, Bo [1 ]
Ma, Yong [1 ]
Li, Hao [1 ]
Liang, Kun [1 ]
机构
[1] Huazhong Univ Sci & Technol, Elect & Informat Engn Dept, Wuhan 430074, Hubei, Peoples R China
关键词
infrared image; non-uniformity correction; two-point multi-section; auto division;
D O I
10.1117/12.866403
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Traditional two-point multi-section non-uniformity correction method for infrared imaging use fixed number of sections and division points; this would greatly affect the algorithm's performance. In order to solve this problem, an auto division algorithm based on slope difference of average temperature response curves of IRFPA and least square fitting was supposed. This algorithm calculates the gradient of IRFPA's average temperature response curve and find out the turning points, then the approximate positions of division points are decided according to given number of sections or given threshold for slope difference; after that a least square fitting is performed in each section to produce subsection correction lines; finally adjacent lines are connected with each other to get the complete correction curve. Experimental results showed that the residual non-uniformity of an infrared image is greatly diminished from 0.08 % of traditional two-point multi-section method to 0.03 %. The method is still as simple as the traditional algorithm, while the precision of correction is significantly increased.
引用
收藏
页数:7
相关论文
共 42 条
  • [21] Non-uniformity correction of infrared focal plane array in point target surveillance systems
    Hu, Jing
    Xu, Zhenzhen
    Wan, Qinqin
    INFRARED PHYSICS & TECHNOLOGY, 2014, 66 : 56 - 69
  • [22] Rapid wide dynamic non-uniformity correction algorithm for infrared radiation measurement system
    Li, Zhou
    Zhang, Yao-yu
    Zhou, Hui
    Kong, Xiang-long
    Zhao, Xin-yu
    Li, Xiang-chen
    CHINESE OPTICS, 2024, 17 (06) : 1359 - 1367
  • [23] Infrared Non-Uniformity Correction Algorithm Based on Fast Independent Component Blind Separation
    Nie Hong-Bin
    Zhang Wei
    Cao Yi-Ming
    Zhao Ming
    5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR DETECTOR, IMAGER, DISPLAY, AND ENERGY CONVERSION TECHNOLOGY, 2010, 7658
  • [24] Non-uniformity correction algorithm based on midway histogram equalization in single infrared image
    He, M. (ming8797@gmail.com), 2012, Chinese Society of Astronautics (41):
  • [25] An Infrared Image Non-uniformity Correction Algorithm Based on Pixels' Equivalent Integral Capacitance
    Zhang, Shuanglei
    Wang, Tao
    Xu, Chun
    Chen, Fansheng
    SELECTED PAPERS FROM CONFERENCES OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE OF THE CHINESE SOCIETY OF ASTRONAUTICS 2014, PT II, 2015, 9522
  • [26] Intensity non-uniformity correction of magnetic resonance images using a fuzzy segmentation algorithm
    Shen, S.
    Sandham, W. A.
    Granat, M. H.
    Sterr, A.
    2005 27TH ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY, VOLS 1-7, 2005, : 3035 - 3038
  • [27] Mixed TLS based non-uniformity correction algorithm for infrared focal plane arrays
    Xu, TH
    Hu, HL
    Zhao, YG
    ISTM/2005: 6TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-9, CONFERENCE PROCEEDINGS, 2005, : 5217 - 5219
  • [28] A multi-scale method for automatic correction of intensity non-uniformity in MR images
    Han, C
    Hatsukami, TS
    Yuan, C
    JOURNAL OF MAGNETIC RESONANCE IMAGING, 2001, 13 (03) : 428 - 436
  • [29] Non-Uniformity Correction of Infrared Images Based on Improved CNN With Long-Short Connections
    Li, Timing
    Zhao, Yiqiang
    Li, Yao
    Zhou, Guoqing
    IEEE PHOTONICS JOURNAL, 2021, 13 (03):
  • [30] Non-uniformity correction for infrared focal plane array with image based on neural network algorithm
    Wang, Tingting
    Yu, Junsheng
    Zhou, Yun
    Xing, Yanmin
    Jiang, Yadong
    5TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTOELECTRONIC MATERIALS AND DEVICES FOR DETECTOR, IMAGER, DISPLAY, AND ENERGY CONVERSION TECHNOLOGY, 2010, 7658