Influence of the Carrier Phase on Flicker Measurement for Rectangular Voltage Fluctuations

被引：14
|
作者：
Ruiz, J. [1 ]
Lazkano, A. [1 ]
Gutierrez, J. J. [1 ]
Leturiondo, L. A. [1 ]
Azkarate, I. [1 ]
Saiz, P. [1 ]
Redondo, K. [1 ]
机构：
[1] Univ Basque Country UPV EHU, Dept Elect & Telecommun, Bilbao 48013, Spain
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2012年 / 61卷 / 03期
关键词：
Flicker; International Electrotechnical Commission (IEC) flickermeter; P-st; power quality; rectangular voltage fluctuation; LUMINANCE;
D O I：
10.1109/TIM.2011.2171611
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presents an analysis of the influence of the phase relationship between the fundamental frequency and the rectangular voltage fluctuation on flicker measurements made by the International Electrotechnical Commission (IEC) flickermeter. We analytically studied the origin of the deviations for a set of significant fluctuation frequencies. We found that the nonlinear behavior of the squaring multiplier of the IEC flickermeter produces an additional dc component in instantaneous flicker sensation P-inst for several rectangular fluctuation frequencies. The value of this dc component depends on the phase relationship between the fundamental and the fluctuation frequency. The analysis of this paper has contributed to clarify the definition of some performance tests of the IEC flickermeter standard IEC 61000-4-15 ed.2. This will help develop calibration and verification methods for the flickermeters.
引用
收藏
页码：629 / 635
页数：7
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