Defect probing using positron annihilation and dielectric spectroscopy of PVA/Al thin films

被引：5

作者：

Abdelsalam, S. A. ^{[1
]}

Hemeda, O. M. ^{[1
]}

Sharshar, T. ^{[2
]}

Henaish, A. M. A. ^{[1
,3
]}

Ali, M. M. ^{[1
,4
]}

机构：

[1] Tanta Univ, Fac Sci, Phys Dept, Tanta 31527, Egypt

[2] Kafrelshaikh Univ, Fac Sci, Phys Dept, Kafr El Shaikh, Egypt

[3] Ural Fed Univ, NANOTECH Ctr, Ekaterinburg 620002, Russia

[4] Amer Int Univ, Sch Arts & Sci, Jahra, Kuwait

来源：

JOURNAL OF MOLECULAR STRUCTURE | 2022年 / 1259卷

关键词：

DSC; Positron annihilation spectroscopy; SEM; Dielectric spectroscopy; casting method; PVA; FREE-VOLUME; ELECTRICAL-PROPERTIES; MAGNETIC-PROPERTIES; TEMPERATURE; LIFETIME; DEPENDENCE; COMPOSITES; MEMBRANES; EPOXY;

D O I：

10.1016/j.molstruc.2022.132738

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The Casting method is used to produce nano-composite polymeric thin films (PVA/Al) with varied aluminum content (x = 0.0, 0.04, 0.08, 0.1wt.%). The morphology of thin films is examined by Scanning electron microscopy (SEM), and it is used to approve the homogenous nature of the prepared thin films and to determine the grain size. The obtained nano-composite thin films reveal an enhancement of dielectric properties by adding the nano-filler to polymeric matrix. Also, the Differential Scanning Calorimetry (DSC) studies show an increase in the glass temperature (Tg) by increasing Al content. The microstructure changes of the prepared PVA/Al NPs composite films are investigated using the positron annihilation lifetime (PAL) and Doppler broadening (DB) techniques. The interactions between the PVA and Al NPs through the formation of hydrogen bonding modify the size and concentration of the free volume holes. (c) 2022 Elsevier B.V. All rights reserved.

引用

页数：13

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