DEFECT STRUCTURE STUDIES USING POSITRON-ANNIHILATION SPECTROSCOPY

被引：2
|
作者：
KRISHNAN, R
UPADHYAYA, DD
机构：
来源：
PRAMANA | 1985年 / 24卷 / 1-2期
关键词：
D O I：
10.1007/BF02894838
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：351 / 360
页数：10
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