Automated I-V Measurement System for CMOS SOI Transistor Test Structures

被引：0

作者：

Shvetsov-Shilovskiy, I. I. ^{[1
]}

Nekrasov, P. V. ^{[1
]}

Ulanova, A. V. ^{[1
]}

Smolin, A. A. ^{[1
]}

Sogoyan, A. V. ^{[1
]}

机构：

[1] Natl Res Nucl Univ NRNU MEPhI, Moscow, Russia

来源：

2015 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON) | 2015年

关键词：

PXI-4071; CMOS SOI; automated measurement system; RADIATION; SENSITIVITY; CIRCUITS;

D O I：

暂无

中图分类号：

TN [电子技术、通信技术];

学科分类号：

0809 ;

摘要：

The article discusses the creation of automated system for I-V measurements of CMOS SOI transistor test structures based on National Instruments PXI platform. The article describes the measurement system circuit diagram and its components. Article describes measurement process, user interface and resulting current-voltage characteristic example.

引用

页数：4

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