Near-Field Thermal Imaging by Passive Millimeter-Wave Microscopy

被引：0
|
作者：
Ishino, Manabu [1 ]
Nakamura, Shunichi [1 ]
Nozokido, Tatsuo [1 ]
机构：
[1] Toyama Univ, Grad Sch Sci & Engn Res, Toyama, Japan
来源：
2014 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC) | 2014年
关键词：
Millimeter wave imaging; passive imaging; scanning near-field microscopy; PROBE; SLIT;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Passive millimeter-wave microscopy that enables imaging of the thermal radiation emitted from a sample with a spatial resolution below the diffraction limit is investigated. This technique utilizes a sensitive radiometric receiver in combination with a scanning near-field microscope. Experiments were performed at 50 GHz (lambda = 6 mm) with sample temperatures ranging from 320K down to 200 K, and the performance was shown to be superior to that achieved with passive imaging systems in the infrared region.
引用
收藏
页码：1034 / 1036
页数：3
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