A New and Simple Measurement Approach for Characterizing Intermodulation Distortion Without Using a Spectrum Analyzer

被引：1

作者：

Madan, Anuj ^{[1
]}

Thrivikraman, Tushar ^{[1
]}

Seth, Sachin ^{[1
]}

Verma, Rohan ^{[1
]}

Poh, John ^{[1
]}

Cressler, John D. ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

来源：

2010 TOPICAL MEETING ON SILICON MONOLITHIC INTEGRATED CIRCUITS IN RF SYSTEMS | 2010年

关键词：

Intermodulation distortion; linearity; gain; network analyzer;

D O I：

10.1109/SMIC.2010.5422963

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a novel test setup for characterizing intermodulation distortion in advanced devices and circuits. The setup uses a network analyzer to measure power levels of the fundamental and IM3 products for a two-tone input. It is shown that if the power calibration is correctly performed, the intermodulation distortion terms from a power sweep give the correct value of the input-referred third-order intercept point (IIP3). MOSFETs in a commercially-available 0.13 mu m SiGe BiCMOS technology were measured across bias to validate the measurement approach. The results were subsequently validated using harmonic balance simulations based on design-kit compact models.

引用

页码：88 / 91

页数：4

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